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IEC60410,Description:Sampling Plans And Procedures For Inspection By Attributes,Release Date:1973 |
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IEC60410,Description:Sampling Plans And Procedures For Inspection By Attributes,Release Date:1973 |
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IEC standard:IEC60410 Description:Sampling Plans And Procedures For Inspection By Attributes Release Date:1973 No.1470 The IEC was founded as a nonprofit organization sponsored by universities and engineering societies in 1944 and became dedicated to continuing education for the U.S. electronics industry. During its sixty years, the Consortium has experienced many changes: from the electronics industry to today's information industry; from a national focus to an international perspective; and from an initial base of engineers to a vast cross-section of engineers, managers, and executives. Today, the IEC maintains its mission as a partnership between academia and industry by providing quality continuing education, research, publications, and service programs for the international information industry. |
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