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IEC 60749-14-2003 PDF FORMAT

$39.60

The files are in electronic format(PDF/DOC/DOCX) and will be sent to your email in hours.
Standard Title:
English -- Semiconductor devices Mechanical and climatic test methods Part 14: Robustness of terminations (lead integrity) - Edition 1.0; Together with IEC 60749-31:2002, IEC 60749-3:2002 And IEC 60749-15:2003 Replaces IEC 60749:2002
French -- Dispositifs à semiconducteurs Méthodes d´essais mécaniques et climatiques Partie 14: Robustesse des sorties (intégrité des connexions) - Edition 1.0; Together with IEC 60749-31:2002, IEC 60749-3:2002 And IEC 60749-15:2003 Replaces IEC 60749:2002
Standard NO.:IEC 60749-14-2003
Pages:36


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This product was added to our catalog on Thursday 15 October, 2015.

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