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IEC PAS 62162-2000 PDF FORMAT

$26.40

The files are in electronic format(PDF/DOC/DOCX) and will be sent to your email in hours.
Standard Title:
English -- Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components - Edition 1.0
Standard NO.:IEC PAS 62162-2000
Pages:14


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This product was added to our catalog on Thursday 15 October, 2015.

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